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Record 76 of 16912
Study of electron impact excitation of argon in the extreme ultraviolet - Emission cross section of resonance lines of Ar I, Ar II
Author and Affiliation:
Ajello, Joseph M.(Jet Propulsion Lab., California Inst. of Tech., Pasadena, CA, United States)
James, Geoffrey K.(Jet Propulsion Lab., California Inst. of Tech., Pasadena, CA, United States)
Franklin, Brian(JPL, Pasadena, CA, United States)
Howell, Simon(Manchester, Victoria University, United Kingdom)
Abstract: In a crossed-beam experiment under optically thin conditions the EUV spectrum of argon produced by electron impact excitation is studied. The cross sections of the resonance lines of Ar I and II are measured. The resonance lines of Ar I at 104.8 nm and 106.7 nm, and of Ar II at 91.96 nm and 93.21 nm are the most prominent features of the EUV spectrum between 40 and 110 nm. The relative-flow technique is used to measure the absolute cross sections of these lines at 200 eV. The measurements are compared with previous estimates. The measured emission cross section values at 200 eV for the Ar I lines at 104.8 nm and 106.7 nm, when compared to the electron energy loss estimates of the direct excitation cross sections, establish that cascading is larger for the Ar I resonance lines than previous emission experiments have indicated. In addition, all the emission cross sections for the Ar I and II Rydberg series in the EUV are measured at 0.5 nm resolution. The FUV spectrum is also surveyed and found to consist of Ar II multiplets from simultaneous ionization-excitation.
Publication Date: Dec 14, 1990
Document ID:
19910037119
(Acquired Nov 28, 1995)
Accession Number: 91A21742
Subject Category: ATOMIC AND MOLECULAR PHYSICS
Document Type: Journal Article
Publication Information: Journal of Physics B - Atomic, Molecular and Optical Physics (ISSN 0953-4075); 23; 4355-437
Publisher Information: United Kingdom
Contract/Grant/Task Num: NSF ATM-87-15709; NAS7-100
Financial Sponsor: NASA; United States
Organization Source: Jet Propulsion Lab., California Inst. of Tech.; Pasadena, CA, United States
Manchester Univ.
Description: 22p; In English
Distribution Limits: Unclassified; Publicly available; Unlimited
Rights: Copyright
NASA Terms: ARGON; ATOMIC EXCITATIONS; ELECTRON IMPACT; EXTREME ULTRAVIOLET RADIATION; RESONANCE LINES; ULTRAVIOLET SPECTRA; CROSS SECTIONS; ELECTRON ENERGY; ENERGY DISSIPATION; OPTICAL THICKNESS; RYDBERG SERIES
Imprint And Other Notes: Journal of Physics B - Atomic, Molecular and Optical Physics (ISSN 0953-4075), vol. 23, Dec. 14, 1990, p. 4355-4376. Research supported by USAF.
Miscellaneous Notes: Research supported by USAF
Availability Source: Other Sources
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