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Record Details

Record 84 of 5211
Measurement of surface recombination velocity on heavily doped indium phosphide
Author and Affiliation:
Jenkins, Phillip(Cleveland State Univ., OH, United States)
Ghalla-Goradia, Manju(Cleveland State Univ., OH, United States)
Faur, Mircea(Cleveland State Univ., OH, United States)
Faur, Maria(Cleveland State University, OH, United States)
Bailey, Sheila(NASA Lewis Research Center, Cleveland, OH, United States)
Abstract: Surface recombination velocity (SRV) on heavily doped n-type and p-type InP was measured as a function of surface treatment. For the limited range of substrates and surface treatments studied, SRV and surface stability depend strongly on the surface treatment. SRVs of 100,000 cm/sec in both p-type and n-type InP are obtainable, but in n-type the low-SRV surfaces were unstable, and the only stable surfaces on n-type had SRVs of more than 10to the 6th cm/sec.
Publication Date: Jan 01, 1990
Document ID:
19910057308
(Acquired Nov 28, 1995)
Accession Number: 91A41931
Subject Category: SOLID-STATE PHYSICS
Document Type: Conference Paper
Publication Information: SEE A91-41876
Publisher Information: United States
Meeting Information: 21st IEEE Photovoltaic Specialists Conference; May 21-25, 1990; Kissimmee, FL; United States
Financial Sponsor: NASA; United States
Organization Source: Cleveland State Univ.; OH, United States
NASA Lewis Research Center; Cleveland, OH, United States
Description: 5p; In English
Distribution Limits: Unclassified; Publicly available; Unlimited
Rights: Copyright
NASA Terms: DOPED CRYSTALS; INDIUM PHOSPHIDES; RECOMBINATION COEFFICIENT; SOLAR CELLS; SURFACE PROPERTIES; ARGON LASERS; ELECTROMAGNETIC ABSORPTION; N-TYPE SEMICONDUCTORS; P-TYPE SEMICONDUCTORS; PHOTOLUMINESCENCE; SURFACE TREATMENT
Imprint And Other Notes: IN: IEEE Photovoltaic Specialists Conference, 21st, Kissimmee, FL, May 21-25, 1990, Conference Record. Vol. 1 (A91-41876 17-44). New York, Institute of Electrical and Electronics Engineers, Inc., 1990, p. 399-403.
Availability Source: Other Sources
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