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Laser interferometric measurement of ion electrode shape and charge exchange erosionA novel projected fringe profilometry system was applied to surface contour measurements of an accelerator electrode from an ion thruster. The system permitted noncontact, nondestructive evaluation of the fine and gross structure of the electrode. A 3D surface map of a dished electrode was generated without altering the electrode surface. The same system was used to examine charge exchange erosion pits near the periphery of the electrode to determine the depth, location, and volume of material lost. This electro-optical measurement system allowed rapid nondestructive digital data acquisition coupled with automated computer data-processing. In addition, variable sensitivity allowed both coarse and fine measurements of objects having various surface finishes.
Document ID
19910061163
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Macrae, Gregory S.
(NASA Lewis Research Center Cleveland, OH, United States)
Mercer, Carolyn R.
(NASA Lewis Research Center Cleveland, OH, United States)
Date Acquired
August 14, 2013
Publication Date
June 1, 1991
Subject Category
Instrumentation And Photography
Report/Patent Number
AIAA PAPER 91-2121
Accession Number
91A45786
Distribution Limits
Public
Copyright
Other

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