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Quantum efficiency measurements of Tektronix backside thinned CCDsResults are presented of a program in progress to produce CCDs with high stable quantum efficiency (QE). Measurements made at 253.7 nm over a six-month period showed no significant QE difference between two CCDs manufactured in 1989 and one manufactured in 1988. QE improvement by the addition of a two-layer antireflection coating is about threefold at 400 nm.
Document ID
19910061382
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Delamere, Alan (Ball Corp. Boulder, CO, United States)
Atkinson, Mike (Ball Corp. Boulder, CO, United States)
Rice, James P. (Ball Aerospace Systems Group Boulder, CO, United States)
Blouke, Morley (Tektronix, Inc. Beaverton, OR, United States)
Reed, Richard (National Optical Astronomy Observatories Tucson, AZ, United States)
Date Acquired
August 14, 2013
Publication Date
January 1, 1990
Subject Category
Electronics And Electrical Engineering
Accession Number
91A46005
Distribution Limits
Public
Copyright
Other

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