Material property measurements with post-processed thermal image dataSome of the applications to materials evaluation and property determination of thermographic NDE using digital postprocessing of sequences of thermograms are demonstrated. A generic description is given of the steps used in postprocessing for obtaining material property values.
Document ID
19910066955
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Welch, Christopher S. (College of William and Mary Williamsburg, VA, United States)
Winfree, William P. (College of William and Mary Williamsburg, VA, United States)
Heath, D. M. (College of William and Mary Williamsburg, VA, United States)
Cramer, Elliott (NASA Langley Research Center Hampton, VA, United States)
Howell, Patricia (Analytical Services and Materials, Inc. Hampton, VA, United States)