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Universal aspects of adhesion and atomic force microscopyAdhesive energies are computed for flat and atomically sharp tips as a function of the normal distance to the substrate. The dependence of binding energies on tip shape is investigated. The magnitudes of the binding energies for the atomic force microscope are found to depend sensitively on tip material, tip shape and the sample site being probed. The form of the energy-distance curve, however, is universal and independent of these variables, including tip shape.
Document ID
19920035355
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Banerjea, Amitava
(NASA Lewis Research Center Cleveland; Kent State University, OH, United States)
Smith, John R.
(GM Research Laboratories Warren, MI, United States)
Ferrante, John
(NASA Lewis Research Center Cleveland, OH, United States)
Date Acquired
August 15, 2013
Publication Date
January 1, 1990
Publication Information
Publication: Journal of Physics: Condensed Matter
Volume: 2
ISSN: 0953-8984
Subject Category
Solid-State Physics
Accession Number
92A17979
Distribution Limits
Public
Copyright
Other

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