NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
Real time thermal imaging for analysis and control of crystal growth by the Czochralski techniqueA real time thermal imaging system with temperature resolution better than +/- 0.5 C and spatial resolution of better than 0.5 mm has been developed. It has been applied to the analysis of melt surface thermal field distributions in both Czochralski and liquid encapsulated Czochralski growth configurations. The sensor can provide single/multiple point thermal information; a multi-pixel averaging algorithm has been developed which permits localized, low noise sensing and display of optical intensity variations at any location in the hot zone as a function of time. Temperature distributions are measured by extraction of data along a user selectable linear pixel array and are simultaneously displayed, as a graphic overlay, on the thermal image.
Document ID
19920042071
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Wargo, M. J.
(NASA Headquarters Washington, DC United States)
Witt, A. F.
(MIT Cambridge, MA, United States)
Date Acquired
August 15, 2013
Publication Date
January 1, 1992
Publication Information
Publication: Journal of Crystal Growth
Volume: 116
Issue: 1-2,
ISSN: 0022-0248
Subject Category
Instrumentation And Photography
Accession Number
92A24695
Distribution Limits
Public
Copyright
Other

Available Downloads

There are no available downloads for this record.
No Preview Available