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Phase stability in binary Ti-AlBinary Ti-Al samples containing from 46 to 54 at. pct Al were solidified while undercooled by various amounts using electromagnetic levitation techniques. A detailed thermal history of these samples was obtained with sampling rates as high as 500 KHz during recalescence. This very high sampling rate was essential to resolve the thermal events. Primary alpha solidification was observed in samples containing from 51 to 54 at. pct Al that were undercooled less than about 100 K at solidification. Primary beta solidification was found for all undercoolings tested in samples containing less than 51 at. pct Al and for undercoolings greater than about 100 K in samples containing 51 to 54 at. pct Al.
Document ID
19920044786
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Anderson, C. D.
(NASA Headquarters Washington, DC United States)
Hofmeister, W. H.
(NASA Headquarters Washington, DC United States)
Bayuzick, R. J.
(Vanderbilt University Nashville, TN, United States)
Date Acquired
August 15, 2013
Publication Date
January 1, 1991
Subject Category
Metallic Materials
Meeting Information
Meeting: Alloy Phase Stability and Design
Location: San Francisco, CA
Country: United States
Start Date: April 18, 1990
End Date: April 20, 1990
Sponsors: Materials Research Society
Accession Number
92A27410
Funding Number(s)
CONTRACT_GRANT: NAGW-810
Distribution Limits
Public
Copyright
Other

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