NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
Model-based frequency response characterization of a digital-image analysis system for epifluorescence microscopyConsideration is given to a model-based method for estimating the spatial frequency response of a digital-imaging system (e.g., a CCD camera) that is modeled as a linear, shift-invariant image acquisition subsystem that is cascaded with a linear, shift-variant sampling subsystem. The method characterizes the 2D frequency response of the image acquisition subsystem to beyond the Nyquist frequency by accounting explicitly for insufficient sampling and the sample-scene phase. Results for simulated systems and a real CCD-based epifluorescence microscopy system are presented to demonstrate the accuracy of the method.
Document ID
19920045119
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Hazra, Rajeeb
(NASA Langley Research Center Hampton; College of William and Mary, Williamsburg, VA, United States)
Viles, Charles L.
(NASA Langley Research Center Hampton, VA, United States)
Park, Stephen K.
(College of William and Mary Williamsburg, VA, United States)
Reichenbach, Stephen E.
(Nebraska, University Lincoln, United States)
Sieracki, Michael E.
(College of William and Mary Williamsburg, VA, United States)
Date Acquired
August 15, 2013
Publication Date
March 10, 1992
Publication Information
Publication: Applied Optics
Volume: 31
ISSN: 0003-6935
Subject Category
Instrumentation And Photography
Accession Number
92A27743
Funding Number(s)
CONTRACT_GRANT: NSF OCE-88-13356
Distribution Limits
Public
Copyright
Other

Available Downloads

There are no available downloads for this record.
No Preview Available