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Atomic oxygen effects on thin film space coatings studied by spectroscopic ellipsometry, atomic force microscopy, and laser light scatteringThe University of Nebraska is currently evaluating Low Earth Orbit (LEO) simulation techniques as well as a variety of thin film protective coatings to withstand atomic oxygen (AO) degradation. Both oxygen plasma ashers and an electron cyclotron resonance (ECR) source are being used for LEO simulation. Thin film coatings are characterized by optical techniques including Variable Angle Spectroscopic Ellipsometry, Optical spectrophotometry, and laser light scatterometry. Atomic Force Microscopy (AFM) is also used to characterize surface morphology. Results on diamondlike carbon (DLC) films show that DLC degrades with simulated AO exposure at a rate comparable to Kapton polyimide. Since DLC is not as susceptible to environmental factors such as moisture absorption, it could potentially provide more accurate measurements of AO fluence on short space flights.
Document ID
19920048676
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Synowicki, R. A.
(NASA Lewis Research Center Cleveland, OH, United States)
Hale, Jeffrey S.
(NASA Lewis Research Center Cleveland, OH, United States)
Woollam, John A.
(Nebraska, University Lincoln, United States)
Date Acquired
August 15, 2013
Publication Date
January 1, 1992
Subject Category
Chemistry And Materials (General)
Report/Patent Number
AIAA PAPER 92-2172
Meeting Information
Meeting: AIAA Materials Specialist Conference
Location: Dallas, TX
Country: United States
Start Date: April 16, 1992
End Date: April 17, 1992
Accession Number
92A31300
Funding Number(s)
CONTRACT_GRANT: NAG3-95
Distribution Limits
Public
Copyright
Other

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