Ultrasonic time-of-flight monitoring of the position of the liquid/solid interface during the Bridgman growth of germanium

Ultrasound has been used to track the movement of the solid/liquid interface during the vertical Bridgman growth of germanium. Digitally processed data representing the received ultrasonic signal indicated a time lag prior to crystal growth, and showed a growth rate close to the pulling rate of the furnace. No effect of the ultrasonic energy on the growth of the crystal or on the formation of defects was observed. The interface was located to within 0.3 mm in the presence of substantial temperature gradients. An extension of the work presented could lead to a tomographic reconstruction of the interface shape.