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Comparison of spectroscopic properties of Tm and Ho in YAG and YLF crystalsThe paper compares the cross-relaxation, energy transfer and loss processes in Tm- and Ho-doped YAG and YLF as a function of temperature, Tm concentration, and excitation power. Significant differences in the behavior of Tm and Tm,Ho in YAG and YLF crystals were found. The cross-relaxation rates of Tm(6 pct) are faster in YLF (about 5 microsec) than YAG (about 10 microsec). The energy transfer rates between Tm and Ho are faster in YLF than YAG. The time it takes for the maximum intensity of 1.7-micron emission to drop 10 percent is 25 microsec for YLF:Tm(6 pct),Ho(0.6 pct) and 65 microsec YAG:Tm(6 pct),Ho(0.5 pct). The losses occurring with increasing pump power for 2.1-micron emission of the above samples are 30 percent less in YLF than YAG. These qualitative differences point to YLF as a valuable 2-micron laser host material.
Document ID
19920068642
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Armagan, G.
(NASA Langley Research Center Hampton, VA, United States)
Buoncristiani, A. M.
(Christopher Newport College Newport News, VA, United States)
Inge, A. T.
(NASA Langley Research Center Hampton, VA, United States)
Di Bartolo, B.
(Boston College Chestnut Hill, MA, United States)
Date Acquired
August 15, 2013
Publication Date
January 1, 1991
Subject Category
Lasers And Masers
Meeting Information
Meeting: Topical Meeting of the OSA Proceedings on Advanced Solid-State Lasers
Location: Hilton Head, SC
Country: United States
Start Date: March 18, 1991
End Date: March 20, 1991
Sponsors: OSA, IEEE
Accession Number
92A51266
Funding Number(s)
CONTRACT_GRANT: NAG1-796
CONTRACT_GRANT: NAG1-955
Distribution Limits
Public
Copyright
Other

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