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Apparatus Measures Seebeck Coefficient And ResistivityElectrical measurements made by four point probes, two of which double as temperature probes. Laboratory apparatus measures both Seebeck coefficients and electrical resistivities of candidate thermoelectric materials at temperatures from ambient to 1,300 K. Apparatus makes possible to take both measurements alternately and in rapid succession during same heating cycle, thereby reducing distortion.
Document ID
19930000270
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Zoltan, Leslie D.
(Caltech)
Wood, Charles
(Caltech)
Fleurial, Jean-Pierre
(Caltech)
Liu, Yixin
(Caltech)
Date Acquired
August 16, 2013
Publication Date
May 1, 1993
Publication Information
Publication: NASA Tech Briefs
Volume: 17
Issue: 5
ISSN: 0145-319X
Subject Category
Physical Sciences
Report/Patent Number
NPO-18422
Accession Number
93B10270
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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