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Scanning For Hotspots In Lamp FilamentsScanning photometer designed for use in investigation of failures of incandescent lamp filaments. Maps brightness as function of position along each filament to identify bright (hot) spots, occurring at notches and signifying incipient breaks or rewelds. Also used to measure nonuniformity in outputs of such linear devices as light-emitting diodes, and to measure diffraction patterns of lenses.
Document ID
19930000325
Document Type
Other - NASA Tech Brief
Authors
Powers, Charles E.
(NASA Goddard Space Flight Center, Greenbelt, MD.)
Van Sant, Tim
(NASA Goddard Space Flight Center, Greenbelt, MD.)
Leidecker, Henning
(NASA Goddard Space Flight Center, Greenbelt, MD.)
Date Acquired
August 16, 2013
Publication Date
June 1, 1993
Publication Information
Publication: NASA Tech Briefs
Volume: 17
Issue: 6
ISSN: 0145-319X
Subject Category
Physical Sciences
Report/Patent Number
GSC-13531
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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