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Postirradiation Effects In Integrated CircuitsTwo reports discuss postirradiation effects in integrated circuits. Presents examples of postirradiation measurements of performances of integrated circuits of five different types: dual complementary metal oxide/semiconductor (CMOS) flip-flop; CMOS analog multiplier; two CMOS multiplying digital-to-analog converters; electrically erasable programmable read-only memory; and semiconductor/oxide/semiconductor octal buffer driver.
Document ID
19930000479
Document Type
Other - NASA Tech Brief
Authors
Shaw, David C.
(Caltech)
Barnes, Charles E.
(Caltech)
Date Acquired
August 16, 2013
Publication Date
August 1, 1993
Publication Information
Publication: NASA Tech Briefs
Volume: 17
Issue: 8
ISSN: 0145-319X
Subject Category
Electronic Components And Circuits
Report/Patent Number
NPO-18590
Accession Number
93B10479
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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