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Microelectronic Chips For Radiation-Dose TestsCustom-made single-chip complementary metal-oxide semiconductor (CMOS) integrated circuit designed to reveal effects of ionizing radiation on itself and similar integrated circuits. Potential terrestrial use: safety-oriented monitoring of ionizing radiation at nuclear powerplants, nuclear-waste sites, and the like.
Document ID
19930000544
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Buehler, Martin G. (Caltech)
Lin, Yu-Sang (Caltech)
Ray, Kevin P. (Caltech)
Sokoloski, Martin M. (Caltech)
Date Acquired
August 16, 2013
Publication Date
September 1, 1993
Publication Information
Publication: NASA Tech Briefs
Volume: 17
Issue: 9
ISSN: 0145-319X
Subject Category
Electronic Components And Circuits
Report/Patent Number
NPO-18720
Accession Number
93B10544
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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