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Noncontact Measurement Of Sizes And Eccentricities Of HolesSemiautomatic eddy-current-probe apparatus makes noncontact measurements of nominally round holes in electrically conductive specimens and processes measurement data into diameters and eccentricities of holes. Includes x-y translation platform, which holds specimen and moves it horizontally. Probe mounted on probe scanner, positioning probe along vertical (z) direction and rotates probe about vertical axis at preset low speed. Eddy-current sensing coil mounted in side of probe near tip. As probe rotates, impedance analyzer measures electrical impedance (Z) of coil as function of instantaneous rotation angle. Translation and rotation mechanisms and impedance analyzer controlled by computer, which also processes impedance-measurement data.
Document ID
19930000632
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Chern, Engmin J.
(NASA Goddard Space Flight Center, Greenbelt, MD.)
Date Acquired
August 16, 2013
Publication Date
October 1, 1993
Publication Information
Publication: NASA Tech Briefs
Volume: 17
Issue: 10
ISSN: 0145-319X
Subject Category
Electronic Systems
Report/Patent Number
GSC-13504
Accession Number
93B10632
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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