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Analyzing For Light Elements By X-Ray ScatteringNondestructive method of determining concentrations of low-atomic-number elements in liquids and solids involves measurements of Compton and Rayleigh scattering of x rays. Applied in quantitative analysis of low-atomic-number constituents of alloys, of contaminants and corrosion products on surfaces of alloys, and of fractions of hydrogen in plastics, oils, and solvents.
Document ID
19930000638
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Ross, H. Richard (Sverdrup Technology, Inc.)
Date Acquired
August 16, 2013
Publication Date
October 1, 1993
Publication Information
Publication: NASA Tech Briefs
Volume: 17
Issue: 10
ISSN: 0145-319X
Subject Category
Physical Sciences
Report/Patent Number
SSC-00015
Accession Number
93B10638
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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