NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
Determination of atomic oxygen fluence using spectrophotometric analysis of infrared transparent witness coupons for long duration exposure testsAtomic oxygen degradation is one of several major threats to the durability of spaceborne systems in low Earth orbit. Ground-based simulations are conducted to learn how to minimize the adverse effects of atomic oxygen exposure. Assessing the fluence of atomic oxygen in test chambers such as a plasma asher over long periods of time is necessary for accurate determination of atomic oxygen exposure. Currently, an atomic oxygen susceptible organic material such as Kapton is placed next to samples as a witness coupon and its mass loss is monitored and used to determine the effective atomic oxygen fluence. However, degradation of the Kapton witness coupons occurs so rapidly in plasma ashers that for any long term test many witness coupons must be used sequentially in order to keep track of the fluence. This necessitates opening vacuum to substitute fresh coupons. A passive dosimetry technique was sought to monitor atomic oxygen exposure over longer periods without the need to open the plasma asher to the atmosphere. This paper investigates the use of spectrophotometric analysis of durable IR transparent witness coupons to measure atomic oxygen exposure for longer duration testing. The method considered would be conductive to making in situ measurements of atomic oxygen fluence.
Document ID
19930013416
Document Type
Technical Memorandum (TM)
Authors
Podojil, Gregg M. (Cleveland State Univ. OH., United States)
Jaworske, Donald A. (NASA Lewis Research Center Cleveland, OH, United States)
Date Acquired
September 6, 2013
Publication Date
February 1, 1993
Subject Category
CHEMISTRY AND MATERIALS (GENERAL)
Report/Patent Number
NAS 1.15:106021
NASA-TM-106021
E-7582
Funding Number(s)
PROJECT: RTOP 506-41-41
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

Available Downloads

NameType 19930013416.pdf STI