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A Novel Method for Characterization of Superconductors: Physical Measurements and Modeling of Thin FilmsA method for characterization of granular superconducting thin films has been developed which encompasses both the morphological state of the sample and its fabrication process parameters. The broad scope of this technique is due to the synergism between experimental measurements and their interpretation using numerical simulation. Two novel technologies form the substance of this system: the magnetically modulated resistance method for characterizing superconductors; and a powerful new computer peripheral, the Parallel Information Processor card, which provides enhanced computing capability for PC computers. This enhancement allows PC computers to operate at speeds approaching that of supercomputers. This makes atomic scale simulations possible on low cost machines. The present development of this system involves the integration of these two technologies using mesoscale simulations of thin film growth. A future stage of development will incorporate atomic scale modeling.
Document ID
19930016395
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Kim, B. F.
(Johns Hopkins Univ. Laurel, MD, United States)
Moorjani, K.
(Johns Hopkins Univ. Laurel, MD, United States)
Phillips, T. E.
(Johns Hopkins Univ. Laurel, MD, United States)
Adrian, F. J.
(Johns Hopkins Univ. Laurel, MD, United States)
Bohandy, J.
(Johns Hopkins Univ. Laurel, MD, United States)
Dolecek, Q. E.
(Johns Hopkins Univ. Laurel, MD, United States)
Date Acquired
September 6, 2013
Publication Date
February 1, 1993
Publication Information
Publication: NASA, Washington, Technology 2002: The Third National Technology Transfer Conference and Exposition, Volume 1
Subject Category
Solid-State Physics
Accession Number
93N25584
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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