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Texturing of InP surfaces for device applicationsA unique process for texturing InP (100) wafers by anisotropic etching was developed. The process produces irregular V-grooves on the surface, which reduce the surface reflectivity. The process does not require photolithography or masking. The etching characteristics depend on doping, with etching tending to proceed more rapidly on the more heavily doped samples. Reduced reflectivity surfaces formed using this process can be applied to solar cells, photodetectors, and other optoelectronic devices.
Document ID
19930019429
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Bailey, Sheila G.
(NASA Lewis Research Center Cleveland, OH, United States)
Fatemi, Navid S.
(Sverdrup Technology, Inc. Brook Park, OH., United States)
Landis, Geoffrey A.
(Sverdrup Technology, Inc. Brook Park, OH., United States)
Date Acquired
September 6, 2013
Publication Date
April 1, 1992
Subject Category
Metallic Materials
Report/Patent Number
NAS 1.15:106061
NASA-TM-106061
E-7664
Meeting Information
Meeting: Materials Research Society Spring Meeting
Location: San Francisco, CA
Country: United States
Start Date: April 27, 1992
End Date: May 1, 1992
Sponsors: Materials Research Society
Accession Number
93N28618
Funding Number(s)
PROJECT: RTOP 506-41-11
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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