Sapphire fiber interferometer for microdisplacement measurements at high temperatureAttention is given to the use of a short-length multimode sapphire rod as an extension to a conventional Michelson interferometric configuration, but with operation of Fabry-Perot cavity-based sensor element type. The performance of such a device as an interferometric sensor is demonstrated for a case where the interference between the reflections from the sapphire-air interface and an air-metallic surface is inspected for microdisplacements of the metallic surface. A detailed account is given of the sensor's fabrication procedure; results are presented for the detection of surface-acoustic waves.
Document ID
19930034702
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Murphy, Kent A. (NASA Langley Research Center Hampton, VA, United States)
Feth, Shari (NASA Langley Research Center Hampton, VA, United States)
Vengsarkar, Ashish M. (NASA Langley Research Center Hampton, VA, United States)
Claus, Richard O. (Virginia Polytechnic Inst. and State Univ. Blacksburg, United States)
Date Acquired
August 15, 2013
Publication Date
January 1, 1992
Publication Information
Publication: In: Review of progress in quantitative nondestructive evaluation. Vol. 11A; Proceedings of the 18th Annual Review, Brunswick, ME, July 28-Aug. 2, 1991 (A93-18576 05-38)