NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
Sapphire fiber interferometer for microdisplacement measurements at high temperaturesWe report the use of a short-length, multimode sapphire rod as an extension to a Michelson configuration, but operated as a low-finesse Fabry-Perot cavity. We demonstrate the performance of such a device as an interferometric sensor, where the interference between the reflections from the sapphire-air interface and an air-metallic surface is observed for microdisplacement of the metallic surface which is placed close to the sapphire endface. We describe in detail the fabrication procedure and present results obtained from the detection of temperature changes, applied strain, and surface acoustic waves.
Document ID
19930037082
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Murphy, Kent A.
(NASA Langley Research Center Hampton, VA, United States)
Fogg, Brian R.
(NASA Langley Research Center Hampton, VA, United States)
Wang, George Z.
(NASA Langley Research Center Hampton, VA, United States)
Vengsarkar, Ashish M.
(NASA Langley Research Center Hampton, VA, United States)
Claus, Richard O.
(Virginia Polytechnic Inst. and State Univ. Blacksburg, United States)
Date Acquired
August 16, 2013
Publication Date
January 1, 1991
Publication Information
Publication: In: Fiber optic smart structures and skins IV; Proceedings of the Meeting, Boston, MA, Sept. 5, 6, 1991 (A93-21068 06-35)
Publisher: Society of Photo-Optical Instrumentation Engineers
Subject Category
Instrumentation And Photography
Accession Number
93A21079
Distribution Limits
Public
Copyright
Other

Available Downloads

There are no available downloads for this record.
No Preview Available