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Self-checking sequential circuit design using m-out-of-n codesA technique for designing sequential circuits which are totally self-checking for single stuck at faults is presented. This technique uses m-out-of-n codes for state assignments and for output encoding. The next stage logic and the output logic are implemented such that any stuck-at-fault will either create a single bit error or unidirectional multibit error at the output. The technique has been applied to MCNC benchmark circuits and the overhead is estimated.
Document ID
19930044006
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Busaba, F. Y.
(NASA Lyndon B. Johnson Space Center Houston, TX, United States)
Lala, P. K.
(North Carolina Agricultural and Technical State Univ. Greensboro, United States)
Date Acquired
August 16, 2013
Publication Date
January 7, 1993
Publication Information
Publication: Electronics Letters
Volume: 29
Issue: 1
ISSN: 0013-5194
Subject Category
Electronics And Electrical Engineering
Accession Number
93A28003
Funding Number(s)
CONTRACT_GRANT: F49620-89-C-0069
CONTRACT_GRANT: NAG9-504
Distribution Limits
Public
Copyright
Other

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