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Polarization sensitivity analysis of an earth remote sensing instrument - The MODIS-N phase B studyPolarization analysis software that employs Jones matrix formalism to calculate the polarization sensitivity of an instrument design was developed at Hughes Danbury Optical Systems. The code is capable of analyzing the full ray bundle at its angles of incidence for each optical surface. Input is based on the system ray trace and the thin film coating design at each surface. The MODIS-N (Moderate Resolution Imaging Spectrometer) system is used to demonstrate that it is possible to meet stringent requirements on polarization insensitivity associated with planned remote sensing instruments. Analysis indicates that a polarization sensitivity less than or equal to 2 percent was achieved in all desired spectral bands at all pointing angles, per specification. Polarization sensitivities were as high as 10 percent in similar remote sensing instruments.
Document ID
19930049407
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Waluschka, E.
(NASA Goddard Space Flight Center Greenbelt, MD; Hughes Danbury Optical Systems, Inc., CT, United States)
Silverglate, P.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Ftaclas, C.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Turner, A.
(Hughes Danbury Optical Systems, Inc. CT, United States)
Date Acquired
August 16, 2013
Publication Date
January 1, 1992
Publication Information
Publication: In: Polarization analysis and measurement; Proceedings of the Meeting, San Diego, CA, July 19-21, 1992 (A93-33401 12-35)
Publisher: Society of Photo-Optical Instrumentation Engineers
Subject Category
Spacecraft Instrumentation
Accession Number
93A33404
Funding Number(s)
CONTRACT_GRANT: NAS5-30150
Distribution Limits
Public
Copyright
Other

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