Uniformity and transmission of proportional counter window materials for use with AXAFThe X-ray detection system used to calibrate the Advanced X-ray Astrophysics Facility (AXAF) mirrors will include gas flow and sealed proportional counters. To meet the ultimate 1 percent goal of the calibration project, the transmission and uniformity of the windows must be well known for the soft X-ray wavelengths involved. Various window materials for use with proportional counters are examined for transmission at X-ray wavelengths in the range of 0.1 to 5.9 keV. These include the usual window materials (polypropylene and beryllium), as well as materials only recently employed for detector applications (polyimide and diamond). The transmission uniformity of beryllium at 1.49 keV is examined with a microchannel plate detector, producing a 'shadowgraph' of the window material illuminated with soft X-rays. This technique allows us to investigate nonuniformities on a spatial scale of about .2 mm.
Document ID
19930050400
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Flanagan, K. (NASA Marshall Space Flight Center Huntsville, AL, United States)
Austin, G. K. (NASA Marshall Space Flight Center Huntsville, AL, United States)
Cobuzzi, J. P. (NASA Marshall Space Flight Center Huntsville, AL, United States)
Goddard, R. (NASA Marshall Space Flight Center Huntsville, AL, United States)
Hughes, J. P. (NASA Marshall Space Flight Center Huntsville, AL, United States)
Mclaughlin, E. R. (NASA Marshall Space Flight Center Huntsville, AL, United States)
Podgorski, W. A. (NASA Marshall Space Flight Center Huntsville, AL, United States)
Rose, V. (NASA Marshall Space Flight Center Huntsville, AL, United States)
Roy, A. G. (NASA Marshall Space Flight Center Huntsville, AL, United States)
Zombeck, M. V. (Smithsonian Astrophysical Observatory Cambridge, MA, United States)
Date Acquired
August 16, 2013
Publication Date
January 1, 1991
Publication Information
Publication: In: EUV, X-ray, and gamma-ray instrumentation for astronomy II; Proceedings of the Meeting, San Diego, CA, July 24-26, 1991 (A93-34376 13-35)
Publisher: Society of Photo-Optical Instrumentation Engineers