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Ellipsometric study of ambient-produced overlayer growth rate on YBa2Cu3O(7-x) filmsAn ellipsometric study of ambient-reaction-produced BaCO3 overlayer growth on laser-ablated YBCO is presented as a function of time. The effects of the anisotropy of YBCO on the ellipsometric data inversion process are discussed, and it is concluded that with certain restrictions on the data acquisition method, the anisotropic substrate can be adequately modeled by its isotropic pseudodielectric function for the purpose of overlayer thickness estimation. It is found that after an initial period of rapid growth attributed to the chemical reaction of the exposed surface bonds, the BaCO3 overlayer growth is linear at 1-2 A per day. This slow growth rate is attributed to the complexity of the BaCO3-forming reaction, together with the need for ambient reactants to diffuse through the overlayer.
Document ID
19930055365
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
External Source(s)
Authors
Sieg, Robert M.
(Cleveland State Univ. OH, United States)
Alterovitz, Samuel A.
(NASA Lewis Research Center Cleveland, OH, United States)
Warner, Joseph D.
(NASA Lewis Research Center Cleveland, OH, United States)
Date Acquired
August 16, 2013
Publication Date
May 1, 1993
Publication Information
Publication: Journal of Applied Physics
Volume: 73
Issue: 9
ISSN: 0021-8979
Subject Category
Solid-State Physics
Accession Number
93A39362
Distribution Limits
Public
Copyright
Other

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