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The X-ray reflectivity of the AXAF VETA-I opticsThe study measures the X-ray reflectivity of the AXAF VETA-I optic and compares it with theoretical predictions. Measurements made at energies of 0.28, 0.9, 1.5, 2.1, and 2.3 keV are compared with predictions based on ray trace calculations. Results on the variation of the reflectivity with energy as well as the absolute value of the reflectivity are presented. A synchrotron reflectivity measurement with a high-energy resolution over the range 0.26 to 1.8 keV on a flat Zerodur sample is also reported. Evidence is found for contamination of the flat by a thin layer of carbon on the surface, and the possibility of alteration of the surface composition of the VETA-I mirror, perhaps by the polishing technique. The overall agreement between the measured and calculated effective area of VETA-I is between 2.6 and 10 percent. Measurements at individual energies deviate from the best-fitting calculation to 0.3 to 0.8 percent, averaging 0.6 percent at energies below the high energy cutoff of the mirror reflectivity, and are as high as 20.7 percent at the cutoff.
Document ID
19930055620
Document Type
Conference Paper
Authors
Kellogg, E. (NASA Marshall Space Flight Center Huntsville, AL, United States)
Chartas, G. (NASA Marshall Space Flight Center Huntsville, AL, United States)
Graessle, D. (NASA Marshall Space Flight Center Huntsville, AL, United States)
Hughes, J. P. (NASA Marshall Space Flight Center Huntsville, AL, United States)
Van Speybroeck, L. (NASA Marshall Space Flight Center Huntsville, AL, United States)
Zhao, Ping (Harvard-Smithsonian Center for Astrophysics Cambridge, MA, United States)
Weisskopf, M. C. (NASA Marshall Space Flight Center Huntsville, AL, United States)
Elsner, R. F. (NASA Marshall Space Flight Center Huntsville, AL, United States)
O'Dell, S. L. (NASA Marshall Space Flight Center Huntsville, AL, United States)
Date Acquired
August 16, 2013
Publication Date
January 1, 1993
Publication Information
Publication: In: Multilayer and grazing incidence X-ray(EUV optics for astronomy and projection lithography; Proceedings of the Meeting, San Diego, CA, July 19-22, 1992 (A93-39601 15-74)
Subject Category
OPTICS
Funding Number(s)
CONTRACT_GRANT: NAS8-36123
Distribution Limits
Public
Copyright
Other

Related Records

IDRelationTitle19930055604Analytic PrimaryMultilayer and grazing incidence X-ray/EUV optics for astronomy and projection lithography; Proceedings of the Meeting, San Diego, CA, July 19-22, 1992