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Thin film filter lifetesting results in the extreme ultravioletWe present the results of the thin film filter lifetesting program conducted as part of the NASA Extreme Ultraviolet Explorer (EUVE) satellite mission. This lifetesting program is designed to monitor changes in the transmission and mechanical properties of the EUVE filters over the lifetime of the mission (fabrication, assembly, launch and operation). Witness test filters were fabricated from thin film foils identical to those used in the flight filters. The witness filters have been examined and calibrated periodically over the past seven years. The filters have been examined for evidence of pinholing, mechanical degradation, and oxidation. Absolute transmissions of the flight and witness filters have been measured in the extreme ultraviolet (EUV) over six orders of magnitude at numerous wavelengths using the Berkeley EUV Calibration Facility.
Document ID
19930055649
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Vedder, P. W.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Vallerga, J. V.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Gibson, J. L.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Stock, J.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Siegmund, O. H. W.
(California Univ. Berkeley, United States)
Date Acquired
August 16, 2013
Publication Date
January 1, 1993
Publication Information
Publication: In: Multilayer and grazing incidence X-ray(EUV optics for astronomy and projection lithography; Proceedings of the Meeting, San Diego, CA, July 19-22, 1992 (A93-39601 15-74)
Publisher: Society of Photo-Optical Instrumentation Engineers
Subject Category
Optics
Accession Number
93A39646
Funding Number(s)
CONTRACT_GRANT: NAS5-29298
Distribution Limits
Public
Copyright
Other

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