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Direct observation of porous SiC formed by anodization in HFA process for forming porous SiC from single-crystal SiC wafers has been demonstrated. Porous SiC can be fabricated by anodizing n-type 6H-SiC in HF under UV illumination. TEM reveals pores of sizes 10-30 nm with interpore spacings ranging from roughly 5 to 150 nm. This is the first reported direct observation of porous SiC formation.
Document ID
19930059590
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
External Source(s)
Authors
Shor, Joseph S.
(Kulite Semiconductor Products, Inc. Leonia, NJ, United States)
Grimberg, Ilana
(NASA Lewis Research Center Cleveland, OH, United States)
Weiss, Ben-Zion
(Technion - Israel Inst. of Technology Haifa, United States)
Kurtz, Anthony D.
(Kulite Semiconductor Products, Inc. Leonia, NJ, United States)
Date Acquired
August 16, 2013
Publication Date
May 31, 1993
Publication Information
Publication: Applied Physics Letters
Volume: 62
Issue: 22
ISSN: 0003-6951
Subject Category
Solid-State Physics
Accession Number
93A43587
Distribution Limits
Public
Copyright
Other

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