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X-ray photoelectron spectroscopy study of the stability of Fomblin Z25 on the native oxide of aluminumThin films of Fomblin Z25, a perfluoropolyalkylether lubricant, were vapor deposited onto clean, oxidized aluminum, and onto sapphire surfaces, and their behavior at different temperatures was studied using X-ray photoelectron spectroscopy and temperature desorption spectroscopy (TDS). The interfacial fluid molecules decompose on the native oxide at room temperature, and continue to decompose at elevated temperatures, as previous studies had shown to occur on the clean metal. TDS indicated that different degradation mechanisms were operative for clean and oxidized aluminum. On sapphire substrates, no reaction was observed at room temperature. The native oxide of aluminum is neither passive nor protective towards Fomblin Z25. At higher temperatures (150 C), degradation of the polymer on sapphire produced a debris layer at the interface with a chemical composition similar to the one formed on aluminum oxide. Rubbing a Fomblin film on a single crystal sapphire also induced the decomposition of the lubricant in contact with the interface and the formation of a debris layer.
Document ID
19930060886
Document Type
Reprint (Version printed in journal)
External Source(s)
Authors
Herrera-Fierro, Pilar
(NASA Lewis Research Center Cleveland, OH, United States)
Pepper, Stephen V.
(NASA Lewis Research Center Cleveland, OH, United States)
Jones, William R.
(NASA Lewis Research Center Cleveland, OH, United States)
Date Acquired
August 16, 2013
Publication Date
August 1, 1992
Publication Information
Publication: Journal of Vacuum Science and Technology A
Volume: 10
Issue: 4
ISSN: 0734-2101
Subject Category
Nonmetallic Materials
Distribution Limits
Public
Copyright
Other
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