NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
Diagnosis of NMOS DRAM functional performance as affected by a picosecond dye laserA picosec pulsed dye laser beam was at selected wavelengths successfully used to simulate heavy-ion single-event effects (SEEs) in negative channel NMOS DRAMs. A DRAM was used to develop the test technique because bit-mapping capability and previous heavy-ion upset data were available. The present analysis is the first to establish such a correlation between laser and heavy-ion data for devices, such as the NMOS DRAM, where charge collection is dominated by long-range diffusion, which is controlled by carrier density at remote distances from a depletion region. In the latter case, penetration depth is an important parameter and is included in the present analysis. A single-pulse picosecond dye laser beam (1.5 microns diameter) focused onto a single cell component can upset a single memory cell; clusters of memory cell upsets (multiple errors) were observed when the laser energy was increased above the threshold energy. The multiple errors were analyzed as a function of the bias voltage and total energy of a single pulse. A diffusion model to distinguish the multiple upsets from the laser-induced charge agreed well with previously reported heavy ion data.
Document ID
19930066502
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Kim, Q.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Schwartz, H. R.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Edmonds, L. D.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Zoutendyk, J. A.
(JPL Pasadena, CA, United States)
Date Acquired
August 16, 2013
Publication Date
January 1, 1992
Publication Information
Publication: Solid-State Electronics
Volume: 35
Issue: 7
ISSN: 0038-1101
Subject Category
Electronics And Electrical Engineering
Accession Number
93A50499
Distribution Limits
Public
Copyright
Other

Available Downloads

There are no available downloads for this record.
No Preview Available