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SIMS studies of oxide growth on beta-NiAlThis paper reports on a study of the growth of aluminum oxide on beta-NiAl at temperatures up to 1200 C. The scales have been formed in two-stage experiments using O2-16 and O2-18 gases, and the various isotopic species have been located by direct imaging using SIMS. Supplementary information on oxide morphologies and structures has been obtained by SEM. SIMS images and depth profiles indicate where oxidation has taken place predominantly by cation or anion diffusion at different stages of the growth process. The way in which the presence of small amounts of reactive elements can affect scale growth is also considered. These results help to provide an improved understanding of the mechanism of alumina scale formation, which is of benefit in the development of oxidation-resistant alloys and intermetallics for service at high temperatures.
Document ID
Document Type
Conference Paper
Mitchell, D. F.
(NASA Lewis Research Center Cleveland, OH, United States)
Prescott, R.
(NASA Lewis Research Center Cleveland, OH, United States)
Graham, M. J.
(National Research Council of Canada Inst. for Microstructural Sciences, Ottawa, United States)
Doychak, J.
(NASA Lewis Research Center Cleveland, OH, United States)
Date Acquired
August 16, 2013
Publication Date
January 1, 1992
Publication Information
Publication: In: International SAMPE Technical Conference, 24th and International SAMPE Metals and Metals Processing Conference, 3rd, Toronto, Canada, Oct. 20-22, 1992, Proceedings. Vol. 3 (A93-53376 23-23)
Publisher: Society for the Advancement of Material and Process Engineering
Subject Category
Metallic Materials
Accession Number
Distribution Limits

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