NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
Role of failure-mechanism identification in accelerated testingAccelerated life testing techniques provide a short-cut method to investigate the reliability of electronic devices with respect to certain dominant failure mechanisms that occur under normal operating conditions. However, accelerated tests have often been conducted without knowledge of the failure mechanisms and without ensuring that the test accelerated the same mechanism as that observed under normal operating conditions. This paper summarizes common failure mechanisms in electronic devices and packages and investigates possible failure mechanism shifting during accelerated testing.
Document ID
19930070277
Document Type
Reprint (Version printed in journal)
Authors
Hu, J. M. (NASA Headquarters Washington, DC United States)
Barker, D. (NASA Headquarters Washington, DC United States)
Dasgupta, A. (NASA Headquarters Washington, DC United States)
Arora, A. (Maryland Univ. College Park, United States)
Date Acquired
August 16, 2013
Publication Date
August 1, 1993
Publication Information
Publication: IES, Journal
Volume: 36
Issue: 4
ISSN: 1052-2883
Subject Category
QUALITY ASSURANCE AND RELIABILITY
Distribution Limits
Public
Copyright
Other