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Scanning Tunneling Microscopy analysis of space-exposed polymer filmsThe characterization of the surface of selected space-exposed polymer films by Scanning Tunneling Microscopy (STM) is reported. Principles of STM, an emerging new technique for materials analysis, are reviewed. The analysis of several films which received up to 5.8 years of low Earth orbital (LEO) exposure onboard the NASA Long Duration Exposure Facility (LDEF) is discussed. Specimens included FEP Teflon thermal blanket material, Kapton film, and several experimental polymer films. Ultraviolet and atomic oxygen-induced crazing and erosion are described. The intent of this paper is to demonstrate how STM is enhancing the understanding of LEO space environmental effects on polymer films.
Document ID
19930070381
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Kalil, Carol R.
(Analytical Services and Materials, Inc. Hampton, VA, United States)
Young, Philip R.
(NASA Langley Research Center Hampton, VA, United States)
Date Acquired
August 16, 2013
Publication Date
January 1, 1993
Publication Information
Publication: In: International Instrumentation Symposium, 39th, Albuquerque, NM, May 2-6, 1993, Proceedings (A93-54351 24-35)
Publisher: Instrument Society of America
Subject Category
Nonmetallic Materials
Accession Number
93A54378
Distribution Limits
Public
Copyright
Other

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