NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
Correcting for diffraction in the far-infrared reflectance measurement of rough surfacesThe manner in which diffraction can increase the reflectance measured from very rough surfaces is shown by observations of diffracted light within the instrument profile of a far-IR reflectometer system. A correction to the calibration signal based on numerical integration of the diffracted part of the instrument profile is described. Diffraction correction factors as large as 2.94 have been found with small optics at long wavelength (630 microns). The effect of diffraction on diffuse reflectance measurements of a very rough perfect reflector is shown at wavelengths from 56 to 200 microns.
Document ID
19930071180
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Smith, Sheldon M.
(Sterling Software, Inc.; NASA, Ames Research Center Moffett Field, CA, United States)
Date Acquired
August 16, 2013
Publication Date
January 1, 1993
Publication Information
Publication: In: Stray radiation in optical systems II; Proceedings of the Meeting, San Diego, CA, July 20-22, 1992 (A93-55176 24-74)
Publisher: Society of Photo-Optical Instrumentation Engineers
Subject Category
Instrumentation And Photography
Accession Number
93A55177
Distribution Limits
Public
Copyright
Other

Available Downloads

There are no available downloads for this record.
No Preview Available