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Oscillator strengths of the Si II 181 nanometer resonance multipletWe report Si II experimental log (gf)-values of -2.38(4) for the 180.801 nm line, of -2.18(4) for the 181.693 nm line, and of -3.29(5) for the 181.745 nm line, where the number in parentheses is the uncertainty in the last digit. The overall uncertainties (about 10 percent) include the 1 sigma random uncertainty (about 6 percent) and an estimate of the systematic uncertainty. The oscillator strengths are determined by combining branching fractions and radiative lifetimes. The branching fractions are measured using standard spectroradiometry on an optically thin source; the radiative lifetimes are measured using time-resolved laser-induced fluorescence.
Document ID
19930072126
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
External Source(s)
Authors
Bergeson, S. D.
(NASA Headquarters Washington, DC United States)
Lawler, J. E.
(Wisconsin Univ. Madison, United States)
Date Acquired
August 16, 2013
Publication Date
September 10, 1993
Publication Information
Publication: Astrophysical Journal, Part 2 - Letters
Volume: 414
Issue: 2
ISSN: 0004-637X
Subject Category
Astrophysics
Accession Number
93A56123
Funding Number(s)
CONTRACT_GRANT: NAGW-2908
Distribution Limits
Public
Copyright
Other

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