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Record Details

Record 1 of 777
Electrical Properties Of Capacitors At High Temperatures
Author and Affiliation:
Baumann, E. D.(NASA Lewis Research Center, Cleveland, OH.)
Myers, I. T.(NASA Lewis Research Center, Cleveland, OH.)
Overton, E.(NASA Lewis Research Center, Cleveland, OH.)
Hammoud, A. N.(Sverdrup Technology, Inc.)
Abstract: Brief report describes results of experiments in which capacitance and dielectric loss of glass, metallized-polytetrafluoroethylene, and solid-tantalum capacitor measured at temperatures from 20 degrees C to 200 degrees C. Conclusions drawn concerning suitability of capacitors for use at high temperatures; such as in nuclear powerplants, aircraft, equipment for extracting geothermal energy, switching power supplies, and automotive integrated engine electronics.
Publication Date: May 01, 1994
Document ID:
19940000286
(Acquired Dec 28, 1995)
Accession Number: 94B10286
Subject Category: ELECTRONIC COMPONENTS AND CIRCUITS
Report/Patent Number: LEW-15677
Document Type: NASA Tech Brief
Publication Information: NASA Tech Briefs (ISSN 0145-319X); 18; 5; P. 85
Publisher Information: United States
Financial Sponsor: NASA; United States
Organization Source: NASA Lewis Research Center; Cleveland, OH, United States
Description: In English
Distribution Limits: Unclassified; Publicly available; Unlimited
Rights: No Copyright
NASA Terms: CAPACITORS; ELECTRICAL PROPERTIES; HIGH TEMPERATURE TESTS
Availability Source: National Technology Transfer Center (NTTC), Wheeling, WV
Availability Notes: Additional information available through: National Technology Transfer Center (NTTC), Wheeling, WV 26003, (Tel: 1-800-678-6882).
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