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Automated System Tests High-Power MOSFET'sComputer-controlled system tests metal-oxide/semiconductor field-effect transistors (MOSFET's) at high voltages and currents. Measures seven parameters characterizing performance of MOSFET, with view toward obtaining early indication MOSFET defective. Use of test system prior to installation of power MOSFET in high-power circuit saves time and money.
Document ID
19940000657
Document Type
Other - NASA Tech Brief
Authors
Huston, Steven W. (Rockwell International Corp.)
Wendt, Isabel O. (Rockwell International Corp.)
Date Acquired
August 16, 2013
Publication Date
December 1, 1994
Publication Information
Publication: NASA Tech Briefs
Volume: 18
Issue: 12
ISSN: 0145-319X
Subject Category
ELECTRONIC SYSTEMS
Report/Patent Number
LEW-15255
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.