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Detection of CMOS bridging faults using minimal stuck-at fault test setsThe performance of minimal stuck-at fault test sets at detecting bridging faults are evaluated. New functional models of circuit primitives are presented which allow accurate representation of bridging faults under switch-level simulation. The effectiveness of the patterns is evaluated using both voltage and current testing.
Document ID
19940016637
Document Type
Conference Paper
Authors
Ijaz, Nabeel (Idaho Univ. Moscow, ID, United States)
Frenzel, James F. (Idaho Univ. Moscow, ID, United States)
Date Acquired
September 6, 2013
Publication Date
January 1, 1993
Publication Information
Publication: New Mexico Univ., The Fifth NASA Symposium on VLSI Design
Subject Category
ELECTRONICS AND ELECTRICAL ENGINEERING
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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