Automatic calibration of inductive voltage dividers for the NASA Zeno experiment

Two inductive voltage dividers (IVDs) used for temperature measurements in NASA's Zeno experiment were tested. In order to obtain the required resolution of 10 parts per billion, a 30-bit binary inductive voltage divider developed at the National Institute of Standards and Technology was used to measure the differential linearity of the Zeno IVDs. Automatic measurements were performed on the dividers in the Zeno engineering model at frequencies of 266 and 351 Hz over a ratio range of 0.55-0.56. The measured differential linearity limits the temperature resolution to 5/micro-K.