Extending model-based diagnosis for analog thermodynamical devices

The increasing complexity of process control applications have posed difficult problems in fault detection, isolation, and recovery. Deep knowledge-based approaches, such as model-based diagnosis, have offered some promise in addressing these problems. However, the difficulties of adapting these techniques to situations involving numerical reasoning and noise have limited the applicability of these techniques. This paper describes an extension of classical model-based diagnosis techniques to deal with sparse data, noise, and complex noninvertible numerical models. These diagnosis techniques are being applied to the External Active Thermal Control System for Space Station Freedom.