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Phase-Locked Loop For Measurement Of Small And Large DelaysElectronic signal-generating and processing subsystem of ultrasonic inspection or measurement system consists mainly of variable-and-fixed-frequency, pulsed phase-locked loop (VFFPPLL) measuring phase shifts from 0 degrees to more than 360 degrees with accurancy of 0.112 degrees. VFFPPLL measures phase shifts between transmitted ultrasonic toneburst and its echo, thereby measuring ultrasonic-propagation delay. Used to determine strain in bolt or to track irregular surface of specimen being inspected ultrasonically.
Document ID
19950065210
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Froggatt, Mark
(NASA Langley Research Center, Hampton, VA.)
Date Acquired
August 17, 2013
Publication Date
February 1, 1995
Publication Information
Publication: NASA Tech Briefs
Volume: 19
Issue: 2
ISSN: 0145-319X
Subject Category
Electronic Systems
Report/Patent Number
LAR-14840
Accession Number
95B10051
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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