Neural Networks Analyze Data In Particle-Impact-Noise Tests

Electronic neural networks and computers put to use in analyzing data acquired in particle-impact-noise-detection (PIND) tests of packaged electronic components. PIND tests detect loose particles in packages that cause failures during subsequent operation of packages in presence of accelerations or other effects - for example, loose electrically conductive particles that bounce into positions in which they cause short circuits. Interpretation of test data more objective and accurate. Preliminary results suggest use of neural networks result in significant improvement in quality and reliability and decrease in cost of PIND testing.