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Improved Bakeout Chambers Within Vacuum ChambersImproved bakeout chamber incorporates hardware features that, in conjunction with improved bakeout procedure, reduce spurious contamination and increase accuracy of contamination measurements. When operated according to revised bakeout procedure, they yield measurements of contamination on vacuum-bake test articles more accurate than available previously, and potential for post-bake recontamination of vacuum-baked articles reduced. These chambers improved versions of one described in "Bakeout Chamber Within Vacuum Chamber" (NPO-18959). By enclosing test article in enclave and keeping walls of enclave hotter than test article during bakeout, one prevents condensation of contaminants on inner walls of enclave.
Document ID
19950070312
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Johnson, Kenneth R.
(Caltech)
Taylor, Daniel M.
(Caltech)
Lane, Robert W.
(Caltech)
Cortez, Maximo G.
(Caltech)
Anderson, Mark R.
(Caltech)
Date Acquired
August 16, 2013
Publication Date
October 1, 1995
Publication Information
Publication: NASA Tech Briefs
Volume: 19
Issue: 10
ISSN: 0145-319X
Subject Category
Physical Sciences
Report/Patent Number
NPO-19015
Accession Number
95B10491
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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