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Microchemical Analysis Of Space Operation DebrisReport discusses techniques used in analyzing debris relative to space shuttle operations. Debris collected from space shuttle, expendable launch vehicles, payloads carried by space shuttle, and payloads carried by expendable launch vehicles. Optical microscopy, scanning electron microscopy with energy-dispersive spectrometry, analytical electron microscopy with wavelength-dispersive spectrometry, and X-ray diffraction chosen as techniques used in examining samples of debris.
Document ID
19950070412
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Cummings, Virginia J.
(NASA John F. Kennedy Space Center, Cocoa Beach, FL.)
Kim, Hae Soo
(NASA John F. Kennedy Space Center, Cocoa Beach, FL.)
Date Acquired
August 16, 2013
Publication Date
November 1, 1995
Publication Information
Publication: NASA Tech Briefs
Volume: 19
Issue: 11
ISSN: 0145-319X
Subject Category
Physical Sciences
Report/Patent Number
KSC-11695
Accession Number
95B10591
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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