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Raman scattering characterization of space solar cell structuresA contactless method for the determination of the free-carrier density and the composition distribution across the thickness of 3-5 multi-layer solar cell structures, using the Raman scattering method, is developed. The method includes a step analysis of Raman spectra from optical phonons and phonon-plasmon modes of different layers. The method provides simultaneous measurements of the element composition and the thickness of the structure's layers together with the free-carrier density. The results of measurements of the free-carrier density composition distributions of the liquid phase epitaxy grown AlGaAs/GaAs and GaSb solar cell structures are presented and discussed.
Document ID
19960009323
Document Type
Conference Paper
Authors
Mintairov, Alexander M. (Ioffe (A. F.) Physical-Technical Inst. Saint Petersburg, Russia)
Khvostikov, V. P. (Ioffe (A. F.) Physical-Technical Inst. Saint Petersburg, Russia)
Paleeva, E. V. (Ioffe (A. F.) Physical-Technical Inst. Saint Petersburg, Russia)
Sorokina, S. V. (Ioffe (A. F.) Physical-Technical Inst. Saint Petersburg, Russia)
Date Acquired
August 17, 2013
Publication Date
September 1, 1995
Publication Information
Publication: ESA, Proceedings of 4th European Space Power Conference (ESPC). Volume 2: Photovoltaic Generators, Energy Storage
Subject Category
SPACECRAFT PROPULSION AND POWER
Distribution Limits
Public
Copyright
Other