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Elemental mass spectroscopy of remote surfaces from laser-induced plasmasThe elemental mass analysis of laser-produced ions from Al, Cu, Ge, Ag, and a lunar simulant target when irradiated by a 400-mJ, 8-ns, Nd: YAG laser at 1 x 10(exp 9) W/cm(exp 2), is reported. Ions traveled down a 11.1-m evacuated tube to an ion-trap 1-m time-of-flight (TOF) mass spectrometer where an elemental mass spectrum was recorded. The amount of target material removed per laser pulse and the ionization fraction were measured. The ion spatial distribution was measured at 11.1-m distance and found to be near a fourth-power cosine distribution. These results indicate the ability to mass analyze a surface over a distance of many kilometers for lunar and asteroid surface elemental mass analysis by a remote satellite or lunar rover.
Document ID
19960028791
Acquisition Source
Langley Research Center
Document Type
Technical Memorandum (TM)
Authors
Situ, W.
(NASA Langley Research Center Hampton,VA United States)
DeYoung, R. J.
(NASA Langley Research Center Hampton,VA United States)
Date Acquired
August 17, 2013
Publication Date
January 1, 1994
Publication Information
ISSN: 0003-7028
Subject Category
Earth Resources And Remote Sensing
Report/Patent Number
NAS 1.15:1111526
NASA-TM-1111526
Accession Number
96N29448
Distribution Limits
Public
Copyright
Public Use Permitted.
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