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Thickness Measurement Device for Ice/Water MixtureA device and method are provided for determining the thickness of an ice and water mixture accumulated on the outer surface of an object. First and second total impedance sensors are operated at first and second frequencies over which the dielectric constants for water and ice are substantially the same. Corresponding first and second AC total impedance measuring circuits are coupled to the first and second sensors to produce output voltages based on the total impedance changes sensed by the sensors. A processor is coupled to the first and second measuring circuits to generate a voltage ratio using the measured output voltages. The voltage ratio is indicative of the thickness of the ice and water mixture. The novelty of the present invention is the use of two frequencies and dual geometry impedance sensors in order to be sensitive to the formation of ice. Thus, critical situations created by the presence of solid ice can be averted. The device is simple and is easily incorporated into current technology thereby making its realization cost- effective.
Document ID
19960038471
Acquisition Source
Langley Research Center
Document Type
Other - Patent Application
Authors
Weinstein, Leonard M.
(NASA Langley Research Center Hampton, VA United States)
Date Acquired
August 17, 2013
Publication Date
March 20, 1996
Subject Category
Instrumentation And Photography
Report/Patent Number
NAS 1.71:LAR-15061-1
Patent Application Number: US-Patent-Appl-SN-619779
Report Number: NAS 1.71:LAR-15061-1
Patent Number: NASA-Case-LAR-15061-1
Accession Number
96N30937
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
NASA-Case-LAR-15061-1
Patent Application
US-Patent-Appl-SN-619779
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