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Low Temperature Characterization of Ceramic and Film Power CapacitorsAmong the key requirements for advanced electronic systems is the ability to withstand harsh environments while maintaining reliable and efficient operation. Exposures to low temperature as well as high temperature constitute such stresses. Applications where low temperatures are encountered include deep space missions, medical imaging equipment, and cryogenic instrumentation. Efforts were taken to design and develop power capacitors capable of wide temperature operation. In this work, ceramic and film power capacitors were developed and characterized as a function of temperature from 20 C to -185 C in terms of their dielectric properties. These properties included capacitance stability and dielectric loss in the frequency range of 50 Hz to 100 kHz. DC leakage current measurements were also performed on the capacitors. The manuscript presents the results that indicate good operational characteristic behavior and stability of the components tested at low temperatures.
Document ID
19960045835
Document Type
Conference Paper
Authors
Hammoud, Ahmad (NYMA, Inc. Brook Park, OH United States)
Overton, Eric (NASA Lewis Research Center Cleveland, OH United States)
Date Acquired
September 6, 2013
Publication Date
September 1, 1996
Subject Category
Electronics and Electrical Engineering
Report/Patent Number
NASA-TM-107308
E-10397
NAS 1.15:107308
Meeting Information
1996 Conference on Electrical Insulation and Dielectric Phenomena(Millbrae, CA)
Funding Number(s)
PROJECT: RTOP 233-01-0C
CONTRACT_GRANT: NAS3-27186
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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